数据 | 图片 | 型号 | 品牌 | 简介/封装 | 咨询 |
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CD74ACT283M96 | Texas Instruments | IC 4BIT BINARY FILL ADDER 16SOIC | 咨询 |
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CD4527BPWR | Texas Instruments | IC BCD RATE MULTIPLIER 16-TSSOP | 咨询 |
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CD74ACT283M96E4 | Texas Instruments | IC 4BIT BINARY FILL ADDER 16SOIC | 咨询 |
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CD4007UBEG4 | Texas Instruments | IC DUAL COMPL PAIR W/INV 14-DIP | 咨询 |
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CD4089BEG4 | Texas Instruments | IC BINARY RATE MULTIPLR 16-DIP | 咨询 |
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SN74BCT8244ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 咨询 |
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SN74BCT8245ANTG4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 咨询 |
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SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 咨询 |
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SN74AS181ADWE4 | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 咨询 |
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SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 咨询 |
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CSSTV32852GKFREP | Texas Instruments | IC REGISTERED BUFF 114LFBGA | 咨询 |
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SN74AS181ADWR | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 咨询 |
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SN74AS181ADWRE4 | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 咨询 |
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SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 咨询 |
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74ABT18640DGGRG4 | Texas Instruments | IC SCAN TEST DEVICE 56TSSOP | 咨询 |
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SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 咨询 |
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74ABTH16460DGGRG4 | Texas Instruments | 4-1 MULTIDMULTI TRANSCVR 56TSSOP | 咨询 |
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SN74AS181ANTG4 | Texas Instruments | IC ARITHMETIC LOGIC UNIT 24DIP | 咨询 |
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74GTLP2033DGVRG4 | Texas Instruments | IC LVTTL/GTLP ADJ TXRX 48TVSOP | 咨询 |
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SN74BCT2414DWR | Texas Instruments | IC DECODER MEM DUAL 2-4 20-SOIC | 咨询 |